X-Ray Diffraction

XRD is a non-destructive technique used to analyse the structural order of crystalline materials. As a versatile method, XRD provides detailed information about the identity and quantity of crystalline phases present in polymorphic specimens. Additionally, it offers insights into the crystal structure and interplanar distances of the material. This technique can be applied to specimens in various forms, including powders, thin films, and epitaxial films. By measuring the scattering of X-rays at different angles, XRD enables researchers to obtain a comprehensive understanding of the material's crystallography, making it an essential tool in material science and engineering.

The present implementation of the technique is suitable for mm to cm-size samples as those typically studied by spectroscopy and microscopy.