Low Energy Electron Microscopy

 This Technique is currently not available and thus should not be included in your “Wishlist.”

SPELEEM microscope is being used by a broad range of researchers from different scientific areas such as materials science, nano-science and technology, physics, chemistry, and biophysics. Here are the main imaging modes of the SPELEEM microscope, depending on the illumination source, i.e. electron gun or x-rays or UV photons. 

LEEM make use of the electron gun as and the possible measuring mode are:

- Low Energy Electron Microscopy (LEEM). Study of morphology of crystalline surfaces. Several contrast mechanisms (including Dark Field Imaging) allow the determination of the lateral dimensions of regions with a given crystal structure, the thickness distribution of thin overlayers with monolayer resolution, the imaging of monoatomic surface steps and other morphological features)
- Micro-Low Energy Electron Diffraction (micro-LEED). The diffraction patterns can be collected from areas as small as 100nm.

Using X-ray and UV sources X-PEEM measuring mode can be implemented in the same instrument.