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Upscale to Intermediate TRL / Nano/Micro Layer Analysis

Large Area X-Ray Diffraction

The present application represents an upscale of the standard version of this technique, and it is meant to be specifically applied to/operate on 6" samples, or larger

XRD is a non-destructive technique used to analyse the structural order of crystalline materials. As a versatile method, XRD provides detailed information about the identity and quantity of crystalline phases present in polymorphic specimens. Additionally, it offers insights into the crystal structure and interplanar distances of the material. This technique can be applied to specimens in various forms, including powders, thin films, and epitaxial films. By measuring the scattering of X-rays at different angles, XRD enables researchers to obtain a comprehensive understanding of the material's crystallography, making it an essential tool in material science and engineering.

Available instruments

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Lab's Facility

Catania

CNR-IMM@CT

Instruments' description and comparison